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The relaxation of the hydrodynamic model for semiconductors to the drift-diffusion equations
Hsiao, L; Zhang, KJ
2000-08-10
发表期刊JOURNAL OF DIFFERENTIAL EQUATIONS
ISSN0022-0396
卷号165期号:2页码:315-354
摘要We establish the convergence and consistency of approximate solutions derived hy the modified Godunov scheme for the initial-boundary value problem to a simplified one-dimensional hydrodynamic model for semiconductors using the compensated compactness method. The traces of weak solutions are introduced and then the weak solutions are proved to satisfy the natural boundary conditions. The zero relaxation limit of the hydrodynamic model to the drift-diffusion model is proved when the momentum relaxation time tends to zero. (C) 2000 Academic Press.
关键词hydrodynamic model global weak solution zero relaxation limit traces of weak solutions compensated compactness Godunov scheme
语种英语
WOS研究方向Mathematics
WOS类目Mathematics
WOS记录号WOS:000088679600002
出版者ACADEMIC PRESS INC
引用统计
文献类型期刊论文
条目标识符http://ir.amss.ac.cn/handle/2S8OKBNM/15057
专题中国科学院数学与系统科学研究院
通讯作者Hsiao, L
作者单位CAS, Acad Math & Syst Sci, Beijing 100080, Peoples R China
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GB/T 7714
Hsiao, L,Zhang, KJ. The relaxation of the hydrodynamic model for semiconductors to the drift-diffusion equations[J]. JOURNAL OF DIFFERENTIAL EQUATIONS,2000,165(2):315-354.
APA Hsiao, L,&Zhang, KJ.(2000).The relaxation of the hydrodynamic model for semiconductors to the drift-diffusion equations.JOURNAL OF DIFFERENTIAL EQUATIONS,165(2),315-354.
MLA Hsiao, L,et al."The relaxation of the hydrodynamic model for semiconductors to the drift-diffusion equations".JOURNAL OF DIFFERENTIAL EQUATIONS 165.2(2000):315-354.
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