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A FAST CLASSIFICATION METHOD FOR SINGLE-PARTICLE PROJECTIONS WITH A TRANSLATION AND ROTATION INVARIANT
Wang Xia; Xu Guoliang
2013
Source PublicationJournal of Computational Mathematics
ISSN0254-9409
Volume31Issue:2Pages:137
AbstractThe aim of the electron microscopy image classification is to categorize the projection images into different classes according to their similarities. Distinguishing images usually requires that these images are aligned first. However, alignment of images is a difficult task for a highly noisy data set. In this paper, we propose a translation and rotation invariant based on the Fourier transform for avoiding alignment. A novel classification method is therefore established. To accelerate the classification speed, secondary-classes are introduced in the classification process. The test results also show that our method is very efficient and effective. Classification results using our invariant are also compared with the results using other existing invariants, showing that our invariant leads to much better results.
Language英语
Funding Project[NSFC] ; [NSFC key project] ; [Funds for Creative Research Groups of China]
Document Type期刊论文
Identifierhttp://ir.amss.ac.cn/handle/2S8OKBNM/47512
Collection中国科学院数学与系统科学研究院
Affiliation中国科学院数学与系统科学研究院
Recommended Citation
GB/T 7714
Wang Xia,Xu Guoliang. A FAST CLASSIFICATION METHOD FOR SINGLE-PARTICLE PROJECTIONS WITH A TRANSLATION AND ROTATION INVARIANT[J]. Journal of Computational Mathematics,2013,31(2):137.
APA Wang Xia,&Xu Guoliang.(2013).A FAST CLASSIFICATION METHOD FOR SINGLE-PARTICLE PROJECTIONS WITH A TRANSLATION AND ROTATION INVARIANT.Journal of Computational Mathematics,31(2),137.
MLA Wang Xia,et al."A FAST CLASSIFICATION METHOD FOR SINGLE-PARTICLE PROJECTIONS WITH A TRANSLATION AND ROTATION INVARIANT".Journal of Computational Mathematics 31.2(2013):137.
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