LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS

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	LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS
	LI, W; CAO, JH
	1993-06-01
发表期刊	MICROELECTRONICS AND RELIABILITY
ISSN	0026-2714
卷号	33 期号:8 页码:1069-1072
摘要	In this paper, the limiting distributions of the residual lifetimes of several repairable systems, conditional upon the event that the systems have not been down at any time in (0, t], are proved to be exponential irrespective of the distributions of the lifetimes and repair times of the individual units, provided that their Laplace transforms are rational functions of their arguments.
语种	英语
WOS研究方向	Engineering ; Science & Technology - Other Topics ; Physics
WOS类目	Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied
WOS记录号	WOS:A1993LH30000001
出版者	PERGAMON-ELSEVIER SCIENCE LTD
引用统计
文献类型	期刊论文
条目标识符	http://ir.amss.ac.cn/handle/2S8OKBNM/28299
专题	中国科学院数学与系统科学研究院
通讯作者	LI, W
作者单位	CHINESE ACAD SCI,INST APPL MATH,BEIJING,PEOPLES R CHINA
推荐引用方式 GB/T 7714	LI, W,CAO, JH. LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS[J]. MICROELECTRONICS AND RELIABILITY,1993,33(8):1069-1072.
APA	LI, W,&CAO, JH.(1993).LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS.MICROELECTRONICS AND RELIABILITY,33(8),1069-1072.
MLA	LI, W,et al."LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS".MICROELECTRONICS AND RELIABILITY 33.8(1993):1069-1072.