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LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS
LI, W; CAO, JH
1993-06-01
Source PublicationMICROELECTRONICS AND RELIABILITY
ISSN0026-2714
Volume33Issue:8Pages:1069-1072
AbstractIn this paper, the limiting distributions of the residual lifetimes of several repairable systems, conditional upon the event that the systems have not been down at any time in (0, t], are proved to be exponential irrespective of the distributions of the lifetimes and repair times of the individual units, provided that their Laplace transforms are rational functions of their arguments.
Language英语
WOS Research AreaEngineering ; Science & Technology - Other Topics ; Physics
WOS SubjectEngineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied
WOS IDWOS:A1993LH30000001
PublisherPERGAMON-ELSEVIER SCIENCE LTD
Citation statistics
Document Type期刊论文
Identifierhttp://ir.amss.ac.cn/handle/2S8OKBNM/28299
Collection中国科学院数学与系统科学研究院
Corresponding AuthorLI, W
AffiliationCHINESE ACAD SCI,INST APPL MATH,BEIJING,PEOPLES R CHINA
Recommended Citation
GB/T 7714
LI, W,CAO, JH. LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS[J]. MICROELECTRONICS AND RELIABILITY,1993,33(8):1069-1072.
APA LI, W,&CAO, JH.(1993).LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS.MICROELECTRONICS AND RELIABILITY,33(8),1069-1072.
MLA LI, W,et al."LIMITING DISTRIBUTIONS OF THE RESIDUAL LIFETIMES OF SEVERAL REPAIRABLE SYSTEMS".MICROELECTRONICS AND RELIABILITY 33.8(1993):1069-1072.
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