A stratified sampling model in spherical feature inspection using coordinate measuring machines

CSpace

	A stratified sampling model in spherical feature inspection using coordinate measuring machines
	Fang, KT ; Wang, SG ; Wei, G
	2001
发表期刊	STATISTICS & PROBABILITY LETTERS
ISSN	0167-7152
卷号	51 期号:1 页码:25-34
摘要	A coordinate measuring machine (CMM) is a computer-controlled device that uses a probe to obtain measurements on a manufactured part's surface. In the process of collecting, analyzing and interpreting CMM data, many statistical problems arise. One of them is to choose a model describing the relationship between the location and shape parameters of the part and CMM data and representing the effects of the various sources of randomness of these data. This article suggests a linear model for a stratified sampling scheme, which is one of the most commonly discussed in the CMM literature, in fitting a spherical surface. A feasible generalized least-squares estimator of the part's spherical parameter set is given and its property is studied. Our theoretical results indicate that stratified sampling performs better than random sampling. A similar conclusion was also obtained by Caskey et al. (1990, Design Manufacturing Systems Conf. 779-786) and Xu (1992, M.S. thesis, University of Texas - EI Paso, Mechanical and Industrial Engineering Department, unpublished) using the Monte Carlo experiments for some quite different situations. (C) 2001 Elsevier Science B.V. All rights reserved.
关键词	stratified sampling coordinate measuring machine computer aided design linear model random effect
语种	英语
WOS研究方向	Mathematics
WOS类目	Statistics & Probability
WOS记录号	WOS:000165893800004
出版者	ELSEVIER SCIENCE BV
引用统计
文献类型	期刊论文
条目标识符	http://ir.amss.ac.cn/handle/2S8OKBNM/16046
专题	中国科学院数学与系统科学研究院
作者单位	1.Hong Kong Baptist Univ, Dept Math, Kowloon, Hong Kong, Peoples R China 2.Acad Sinica, Inst Appl Math, Beijing 100080, Peoples R China 3.Beijing Polytech Univ, Dept Appl Math, Beijing 100022, Peoples R China
推荐引用方式 GB/T 7714	Fang, KT,Wang, SG,Wei, G. A stratified sampling model in spherical feature inspection using coordinate measuring machines[J]. STATISTICS & PROBABILITY LETTERS,2001,51(1):25-34.
APA	Fang, KT,Wang, SG,&Wei, G.(2001).A stratified sampling model in spherical feature inspection using coordinate measuring machines.STATISTICS & PROBABILITY LETTERS,51(1),25-34.
MLA	Fang, KT,et al."A stratified sampling model in spherical feature inspection using coordinate measuring machines".STATISTICS & PROBABILITY LETTERS 51.1(2001):25-34.