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Stochastic analysis of a repairable system with three units and two repair facilities
Li, W; Alfa, AS; Zhao, YQ
1998-04-01
发表期刊MICROELECTRONICS AND RELIABILITY
ISSN0026-2714
卷号38期号:4页码:585-595
摘要This paper investigates the availability characteristics and the reliability of a three-dissimilar-unit repairable system with two different repair facilities. Under some practical assumptions, we obtain the explicit expressions of the state probabilities of the system and then the explicit expressions of the following performance measures of the system: (1) the pointwise and steady-state availability; (2) the pointwise and steady-state failure frequency, (3) the pointwise and steady-state renewal frequency; and (4) the reliability and the mean time to system failure. (C) 1998 Elsevier Science Ltd. All rights reserved.
语种英语
WOS研究方向Engineering ; Science & Technology - Other Topics ; Physics
WOS类目Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied
WOS记录号WOS:000073592200014
出版者PERGAMON-ELSEVIER SCIENCE LTD
引用统计
文献类型期刊论文
条目标识符http://ir.amss.ac.cn/handle/2S8OKBNM/13518
专题中国科学院数学与系统科学研究院
通讯作者Li, W
作者单位1.Univ Winnipeg, Dept Math & Stat, Winnipeg, MB R3B 2E9, Canada
2.Univ Manitoba, Dept Mech & Ind Engn, Winnipeg, MB R3T 5V6, Canada
3.Chinese Acad Sci, Inst Appl Math, Beijing 100080, Peoples R China
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GB/T 7714
Li, W,Alfa, AS,Zhao, YQ. Stochastic analysis of a repairable system with three units and two repair facilities[J]. MICROELECTRONICS AND RELIABILITY,1998,38(4):585-595.
APA Li, W,Alfa, AS,&Zhao, YQ.(1998).Stochastic analysis of a repairable system with three units and two repair facilities.MICROELECTRONICS AND RELIABILITY,38(4),585-595.
MLA Li, W,et al."Stochastic analysis of a repairable system with three units and two repair facilities".MICROELECTRONICS AND RELIABILITY 38.4(1998):585-595.
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