Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time

doi:10.1109/ACCESS.2021.3064296

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	Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time
	Gao, Kaiye 1,2
	2021
发表期刊	IEEE ACCESS
ISSN	2169-3536
卷号	9 页码:38649-38659
摘要	Most traditional software reliability growth models (SRGMs) assume immediate fault correction upon detection and therefore only consider fault detection process (FDP). In order to be more realistic, some researchers have tried to incorporate fault correction process (FCP) and fault introduction process (FIP) into the software reliability models. However, it is still difficult to incorporate into the analytical software reliability models some other factors, such as the different fault detection and correction capabilities of debuggers. In this paper, a simulation approach is proposed to model FDP, FIP, and FCP together considering debuggers with different contributions to fault detection rate, different fault correction rate and different fault introduction rate. Besides, this paper also constructed a cost calculation method to optimize the testing design including debuggers assignment and software release time. Some numerical examples are provided to illustrate the proposed model. The results show that the trends of FDP, FCP and FIP are consistent with the intuition to the practice of software testing, and the optimal testing resources allocation and the optimal release time can be obtained according to the proposed model.
关键词	Software Fault detection Biological system modeling Software reliability Licenses Software testing Resource management Fault detection optimization reliability simulation software debugging
DOI	10.1109/ACCESS.2021.3064296
收录类别	SCI
语种	英语
资助项目	National Natural Science Foundation of China[72001027] ; Beijing Municipal Commission of Education[KM202111232007]
WOS研究方向	Computer Science ; Engineering ; Telecommunications
WOS类目	Computer Science, Information Systems ; Engineering, Electrical & Electronic ; Telecommunications
WOS记录号	WOS:000629723700001
出版者	IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
引用统计
文献类型	期刊论文
条目标识符	http://ir.amss.ac.cn/handle/2S8OKBNM/58273
专题	中国科学院数学与系统科学研究院
通讯作者	Gao, Kaiye
作者单位	1.Beijing Informat Sci & Technol Univ, Sch Econ & Management, Beijing 100192, Peoples R China 2.Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100190, Peoples R China
推荐引用方式 GB/T 7714	Gao, Kaiye. Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time[J]. IEEE ACCESS,2021,9:38649-38659.
APA	Gao, Kaiye.(2021).Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time.IEEE ACCESS,9,38649-38659.
MLA	Gao, Kaiye."Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time".IEEE ACCESS 9(2021):38649-38659.