KMS Of Academy of mathematics and systems sciences, CAS
| Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time | |
| Gao, Kaiye1,2 | |
| 2021 | |
| Source Publication | IEEE ACCESS
 |
| ISSN | 2169-3536 |
| Volume | 9Pages:38649-38659 |
| Abstract | Most traditional software reliability growth models (SRGMs) assume immediate fault correction upon detection and therefore only consider fault detection process (FDP). In order to be more realistic, some researchers have tried to incorporate fault correction process (FCP) and fault introduction process (FIP) into the software reliability models. However, it is still difficult to incorporate into the analytical software reliability models some other factors, such as the different fault detection and correction capabilities of debuggers. In this paper, a simulation approach is proposed to model FDP, FIP, and FCP together considering debuggers with different contributions to fault detection rate, different fault correction rate and different fault introduction rate. Besides, this paper also constructed a cost calculation method to optimize the testing design including debuggers assignment and software release time. Some numerical examples are provided to illustrate the proposed model. The results show that the trends of FDP, FCP and FIP are consistent with the intuition to the practice of software testing, and the optimal testing resources allocation and the optimal release time can be obtained according to the proposed model. |
| Keyword | Software Fault detection Biological system modeling Software reliability Licenses Software testing Resource management Fault detection optimization reliability simulation software debugging |
| DOI | 10.1109/ACCESS.2021.3064296 |
| Indexed By | SCI |
| Language | 英语 |
| Funding Project | National Natural Science Foundation of China[72001027] ; Beijing Municipal Commission of Education[KM202111232007] |
| WOS Research Area | Computer Science ; Engineering ; Telecommunications |
| WOS Subject | Computer Science, Information Systems ; Engineering, Electrical & Electronic ; Telecommunications |
| WOS ID | WOS:000629723700001 |
| Publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
| Citation statistics | |
| Document Type | 期刊论文 |
| Identifier | http://ir.amss.ac.cn/handle/2S8OKBNM/58273 |
| Collection | 中国科学院数学与系统科学研究院 |
| Corresponding Author | Gao, Kaiye |
| Affiliation | 1.Beijing Informat Sci & Technol Univ, Sch Econ & Management, Beijing 100192, Peoples R China 2.Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100190, Peoples R China |
| Recommended Citation GB/T 7714 | Gao, Kaiye. Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time[J]. IEEE ACCESS,2021,9:38649-38659. |
| APA | Gao, Kaiye.(2021).Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time.IEEE ACCESS,9,38649-38659. |
| MLA | Gao, Kaiye."Simulated Software Testing Process and Its Optimization Considering Heterogeneous Debuggers and Release Time".IEEE ACCESS 9(2021):38649-38659. |
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