Exponential stability of a reparable multi-state device

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	Exponential stability of a reparable multi-state device
	Hu, Weiwei 1; Xu, Houbao 2; Yu, Jingyuan 1; Zhu, Guangtian 3
	2007-09-01
发表期刊	JOURNAL OF SYSTEMS SCIENCE & COMPLEXITY
ISSN	1009-6124
卷号	20 期号:3 页码:437-443
摘要	The exponential stability of a multi-state device is discussed in this paper. We present that the C-0-semigroup generated by the system operator is quasi-compact and irreducible. It is known that 0 is a simple eigenvalue of the system operator. In combination with this, we obtain that the time-dependent solution exponentially converges to the steady-state solution, which is the positive eigenfuction corresponding to the simple eigenvalue 0.
关键词	C-0-semigroup exponential stability irreducibility quasi-compact
语种	英语
WOS研究方向	Mathematics
WOS类目	Mathematics, Interdisciplinary Applications
WOS记录号	WOS:000255240500012
出版者	SPRINGER
引用统计
文献类型	期刊论文
条目标识符	http://ir.amss.ac.cn/handle/2S8OKBNM/4340
专题	中国科学院数学与系统科学研究院
通讯作者	Hu, Weiwei
作者单位	1.Beijing Inst Informat & Control, Beijing 100037, Peoples R China 2.Beijing Inst Technol, Dept Math, Beijing 100081, Peoples R China 3.Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Hu, Weiwei,Xu, Houbao,Yu, Jingyuan,et al. Exponential stability of a reparable multi-state device[J]. JOURNAL OF SYSTEMS SCIENCE & COMPLEXITY,2007,20(3):437-443.
APA	Hu, Weiwei,Xu, Houbao,Yu, Jingyuan,&Zhu, Guangtian.(2007).Exponential stability of a reparable multi-state device.JOURNAL OF SYSTEMS SCIENCE & COMPLEXITY,20(3),437-443.
MLA	Hu, Weiwei,et al."Exponential stability of a reparable multi-state device".JOURNAL OF SYSTEMS SCIENCE & COMPLEXITY 20.3(2007):437-443.