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Strategic allocation of test units in an accelerated degradation test plan
Ye, Zhi-Sheng1; Hu, Qingpei2; Yu, Dan2
AbstractDegradation is often defined in terms of the change of a key performance characteristic over time. When the degradation is slow, accelerated degradation tests (ADTs) that apply harsh test conditions are often used to obtain reliability information in a timely manner. It is common to see that the initial performance of the test units varies and it is strongly correlated with the degradation rate. Motivated by a real application in the semiconductor sensor industry, this study advocates an allocation strategy in ADT planning by capitalizing on the correlation information. In the proposed strategy, the initial degradation levels of the test units are measured and the measurements are ranked. The ranking information is used to allocate the test units to different factor levels of the accelerating variable. More specifically, we may prefer to allocate units with lower degradation rates to a higher factor level in order to hasten the degradation process. The allocation strategy is first demonstrated using a cumulative-exposure degradation model. Likelihood inference for the model is developed. The optimum test plan is obtained by minimizing the large sample variance of a lifetime quantile at nominal use conditions. Various compromise plans are discussed. A comparison of the results with those from traditional ADTs with random allocation reveals the value of the proposed allocation rule. To demonstrate the broad applicability, we further apply the allocation strategy to two more degradation models which are variants of the cumulative-exposure model.
Keywordcompromise test plan general path model large sample approximate variance order statistics random initial degradation reliability
Funding ProjectNatural Science Foundation of Jiangsu Province[BK20180232] ; National Key R&D Programs of the Ministry of Science and Technology of China[2018YFB0704304] ; National Center for Mathematics and Interdisciplinary Sciences (CAS) ; Key Laboratory of Systems and Control (CAS)
WOS Research AreaEngineering ; Operations Research & Management Science ; Mathematics
WOS SubjectEngineering, Industrial ; Operations Research & Management Science ; Statistics & Probability
WOS IDWOS:000457434800006
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Document Type期刊论文
Corresponding AuthorHu, Qingpei
Affiliation1.Natl Univ Singapore, Dept Ind Syst Engn & Management, Singapore, Singapore
2.Chinese Acad Sci, Acad Math & Syst Sci, Beijing, Peoples R China
Recommended Citation
GB/T 7714
Ye, Zhi-Sheng,Hu, Qingpei,Yu, Dan. Strategic allocation of test units in an accelerated degradation test plan[J]. JOURNAL OF QUALITY TECHNOLOGY,2019,51(1):64-80.
APA Ye, Zhi-Sheng,Hu, Qingpei,&Yu, Dan.(2019).Strategic allocation of test units in an accelerated degradation test plan.JOURNAL OF QUALITY TECHNOLOGY,51(1),64-80.
MLA Ye, Zhi-Sheng,et al."Strategic allocation of test units in an accelerated degradation test plan".JOURNAL OF QUALITY TECHNOLOGY 51.1(2019):64-80.
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