KMS Of Academy of mathematics and systems sciences, CAS
RELIABILITY-ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM WITH A REPLACEABLE REPAIR FACILITY | |
GUO, TD; CAO, JH | |
1992-09-01 | |
发表期刊 | MICROELECTRONICS AND RELIABILITY
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ISSN | 0026-2714 |
卷号 | 32期号:9页码:1237-1240 |
摘要 | This paper considers a two-unit redundant system where the repair facility is subject to failure and can be replaced by a new one when it fails. By using Markov renewal theory we obtain some reliability quantities of the system and the repair facility, respectively. |
语种 | 英语 |
WOS研究方向 | Engineering ; Science & Technology - Other Topics ; Physics |
WOS类目 | Engineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied |
WOS记录号 | WOS:A1992JH51000006 |
出版者 | PERGAMON-ELSEVIER SCIENCE LTD |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.amss.ac.cn/handle/2S8OKBNM/27515 |
专题 | 中国科学院数学与系统科学研究院 |
通讯作者 | GUO, TD |
作者单位 | CHINESE ACAD SCI,INST APPL MATH,BEIJING,PEOPLES R CHINA |
推荐引用方式 GB/T 7714 | GUO, TD,CAO, JH. RELIABILITY-ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM WITH A REPLACEABLE REPAIR FACILITY[J]. MICROELECTRONICS AND RELIABILITY,1992,32(9):1237-1240. |
APA | GUO, TD,&CAO, JH.(1992).RELIABILITY-ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM WITH A REPLACEABLE REPAIR FACILITY.MICROELECTRONICS AND RELIABILITY,32(9),1237-1240. |
MLA | GUO, TD,et al."RELIABILITY-ANALYSIS OF A 2-UNIT REDUNDANT SYSTEM WITH A REPLACEABLE REPAIR FACILITY".MICROELECTRONICS AND RELIABILITY 32.9(1992):1237-1240. |
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