KMS Of Academy of mathematics and systems sciences, CAS
Robust Nanoparticles Detection From Noisy Background by Fusing Complementary Image Information | |
Qian, Yanjun1; Huang, Jianhua Z.2; Li, Xiaodong3; Ding, Yu1 | |
2016-12-01 | |
发表期刊 | IEEE TRANSACTIONS ON IMAGE PROCESSING |
ISSN | 1057-7149 |
卷号 | 26期号:12页码:5713-5726 |
摘要 | This paper studies the problem of detecting the presence of nanoparticles in noisy transmission electron microscopic (TEM) images and then fitting each nanoparticle with an elliptic shape model. In order to achieve robustness while handling low contrast and high noise in the TEM images, we propose an approach to fuse two kinds of complementary image information, namely, the pixel intensity and the gradient (the first derivative in intensity). Our approach entails two main steps: 1) the first step is to, after necessary pre-processing, employ both intensity-based information and gradient-based information to process the same TEM image and produce two independent sets of results and 2) the subsequent step is to formulate a binary integer programming (BIP) problem for conflict resolution among the two sets of results. Solving the BIP problem determines the final nanoparticle identification. We apply our method to a set of TEM images taken under different microscopic resolutions and noise levels. The empirical results show the merit of the proposed method. It can process a TEM image of 1024 x 1024 pixels in a few minutes, and the processed outcomes appear rather robust. |
关键词 | Binary integer programming complementary information fusion image segmentation multi-expert system nanoparticle analysis |
DOI | 10.1109/TIP.2016.2614127 |
语种 | 英语 |
资助项目 | AFOSR DDDAS Program[FA9550-13-1-0075] ; AFOSR DDDAS Program[FA9550-13-1-007] ; NSF[DMS-1208952] ; NSF[CMMI-1000088] ; King Abdullah University of Science and Technology[KUS-CI-016-04] |
WOS研究方向 | Computer Science ; Engineering |
WOS类目 | Computer Science, Artificial Intelligence ; Engineering, Electrical & Electronic |
WOS记录号 | WOS:000386247800006 |
出版者 | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC |
引用统计 | |
文献类型 | 期刊论文 |
条目标识符 | http://ir.amss.ac.cn/handle/2S8OKBNM/23824 |
专题 | 中国科学院数学与系统科学研究院 |
通讯作者 | Qian, Yanjun |
作者单位 | 1.Texas A&M Univ, Dept Ind & Syst Engn, College Stn, TX 77843 USA 2.Texas A&M Univ, Dept Stat, College Stn, TX 77843 USA 3.Chinese Acad Sci, Acad Math & Syst Sci, Beijing 100190, Peoples R China |
推荐引用方式 GB/T 7714 | Qian, Yanjun,Huang, Jianhua Z.,Li, Xiaodong,et al. Robust Nanoparticles Detection From Noisy Background by Fusing Complementary Image Information[J]. IEEE TRANSACTIONS ON IMAGE PROCESSING,2016,26(12):5713-5726. |
APA | Qian, Yanjun,Huang, Jianhua Z.,Li, Xiaodong,&Ding, Yu.(2016).Robust Nanoparticles Detection From Noisy Background by Fusing Complementary Image Information.IEEE TRANSACTIONS ON IMAGE PROCESSING,26(12),5713-5726. |
MLA | Qian, Yanjun,et al."Robust Nanoparticles Detection From Noisy Background by Fusing Complementary Image Information".IEEE TRANSACTIONS ON IMAGE PROCESSING 26.12(2016):5713-5726. |
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