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RELIABILITY-ANALYSIS OF A MULTISTATE ONE-UNIT REPAIRABLE SYSTEM OPERATING UNDER A CHANGING ENVIRONMENT
GUO, TD; CAO, JH
1992-03-01
Source PublicationMICROELECTRONICS AND RELIABILITY
ISSN0026-2714
Volume32Issue:3Pages:439-443
AbstractThis paper studies a multistate repairable system operating under changing environment subject to a Markov process with two states. Failure rates are constant while the repair rates are general. Regenerative technique in MRP is applied to obtain several reliability characteristics of interest to system designers.
Language英语
WOS Research AreaEngineering ; Science & Technology - Other Topics ; Physics
WOS SubjectEngineering, Electrical & Electronic ; Nanoscience & Nanotechnology ; Physics, Applied
WOS IDWOS:A1992GY71700018
PublisherPERGAMON-ELSEVIER SCIENCE LTD
Citation statistics
Cited Times:1[WOS]   [WOS Record]     [Related Records in WOS]
Document Type期刊论文
Identifierhttp://ir.amss.ac.cn/handle/2S8OKBNM/28308
Collection中国科学院数学与系统科学研究院
AffiliationCHINESE ACAD SCI,INST APPL MATH,BEIJING,PEOPLES R CHINA
Recommended Citation
GB/T 7714
GUO, TD,CAO, JH. RELIABILITY-ANALYSIS OF A MULTISTATE ONE-UNIT REPAIRABLE SYSTEM OPERATING UNDER A CHANGING ENVIRONMENT[J]. MICROELECTRONICS AND RELIABILITY,1992,32(3):439-443.
APA GUO, TD,&CAO, JH.(1992).RELIABILITY-ANALYSIS OF A MULTISTATE ONE-UNIT REPAIRABLE SYSTEM OPERATING UNDER A CHANGING ENVIRONMENT.MICROELECTRONICS AND RELIABILITY,32(3),439-443.
MLA GUO, TD,et al."RELIABILITY-ANALYSIS OF A MULTISTATE ONE-UNIT REPAIRABLE SYSTEM OPERATING UNDER A CHANGING ENVIRONMENT".MICROELECTRONICS AND RELIABILITY 32.3(1992):439-443.
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